JPH0317580U - - Google Patents
Info
- Publication number
- JPH0317580U JPH0317580U JP7812289U JP7812289U JPH0317580U JP H0317580 U JPH0317580 U JP H0317580U JP 7812289 U JP7812289 U JP 7812289U JP 7812289 U JP7812289 U JP 7812289U JP H0317580 U JPH0317580 U JP H0317580U
- Authority
- JP
- Japan
- Prior art keywords
- lead
- insulating substrate
- semiconductor
- semiconductor device
- contactor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP7812289U JPH0317580U (en]) | 1989-06-30 | 1989-06-30 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP7812289U JPH0317580U (en]) | 1989-06-30 | 1989-06-30 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH0317580U true JPH0317580U (en]) | 1991-02-21 |
Family
ID=31621113
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP7812289U Pending JPH0317580U (en]) | 1989-06-30 | 1989-06-30 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0317580U (en]) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2015166734A (ja) * | 2014-02-13 | 2015-09-24 | セイコーインスツル株式会社 | Ｉｃ検査用ソケットおよびそれを用いた検査方法 |
-
1989
- 1989-06-30 JP JP7812289U patent/JPH0317580U/ja active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2015166734A (ja) * | 2014-02-13 | 2015-09-24 | セイコーインスツル株式会社 | Ｉｃ検査用ソケットおよびそれを用いた検査方法 |